STM and JESDAF respectively. A typical Human Body Model circuit is presented in Figure 1. Figure 1: Typical Human Body Model Circuit. In September , a small group of ESD control and design stakeholders assembled in a Read More». In the EERC Resource Center. A Dash of Maxwell’s. JESDAF. – IEC (C= pF). – MIL method Pulse parameters. HBM. Reference voltage. 2KV 4KV. Peak current. A A.
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The period between waveform checks may be extended providing test data supports the increased interval.
ESD Tests | Reliability Technology Division | Services | OKI Engineering
It is permitted to use the same sample 3 at the next higher voltage stress level if all parts pass the jesc22 criteria specified jsd22 clause 5 after ESD exposure to a specified voltage level. JEDEC standards and publications are adopted without regard to whether or not their adoption may involve patents or articles, materials, or processes.
When replacing only a single polarity of a given combination, the opposite polarity shall be used when adopting this reverse pin combination alternative. Active discrete devices FETs, transistors, etc. It is recommended that the manufacturers supply the worst-case pin data with each DUT board.
Other suggestions for document improvement: Additionally, the system diagnostics test as defined in 3.
ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING HUMAN BODY MODEL (HBM) | JEDEC
The lead length should be as short as practicable to span the distance between the two farthest pins in the socket while passing through the current probe. If you can provide input, please complete this form and return to: This tester issue was found to divert significant current away from the pins connected to Terminal B, such that the slew-rate of the current at terminal B is lower than seen at Terminal A.
Any pin that is intended to supply power to another circuit on the same chip must be treated as a power pin. Some advanced technologies may be vulnerable to these pulses resulting in an electrical overstress EOS. NOTE 3 R2, used for initial equipment qualification and requalification as specified in 3.
All pins one at time to Gnd3 power pin group 4.
It is recommended that the manufacturers supply the worst-case pin data with each DUT board. This part of the slow decay w114f be excluded in determining the trailing pulse magnitude.
Organizations may obtain permission to reproduce a limited number of copies through entering into a jjesd22 agreement. If at any time the waveforms do not meet the requirements defined within Figure 2 and Table 1 at the V or V level, the testing shall be halted until the waveform is in compliance.
ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING HUMAN BODY MODEL (HBM)
Power pins jrsd22 Power Pin Groups are defined in 4. Otherwise, each power pin must be treated as jwsd22 separate power pin. Included pins connected to charge pump capacitors as power pins. If testing is required at multiple temperatures, testing shall be performed at the lowest temperature first. Connect this pin to Terminal B where it will remain the referenced pin throughout the worst-case pin search and connect one of the remaining pins to Terminal A.
JEDEC standards and publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for use by those other than JEDEC members, whether the a141f is to be used either domestically or internationally.
While most power pins are labeled such that they can be easily recognized as power pins examples: The V level is optional. The test devices shall be within the limits stated in the part drawing for these parameters.
Attach a shorting wire between these pins with the current probe around the shorting wire. JEDEC standards and publications are adopted without regard to whether or not their adoption may involve patents or articles, materials, or processes. The simulator must be capable of supplying pulses with the characteristics required by Figure 2 and Figure 3.
NOTE 6 S2 shall be closed at least 10 milliseconds after the pulse delivery period to ensure the DUT socket is not left in a charged state. Place the current probe around the shorting wire.
Clarified that pin combination sets may be partitioned as far as necessary and performed on different devices to eliminate possible cumulative effects. The test devices shall be within the limits stated in the part drawing for these parameters. In that case, the pin may be tied together with the power pin s connected to the same bus and treated as one pin for Terminal B connection even though it is labeled a different name.
Any pin that is intended to supply power to another circuit on the same chip must be treated as a power pin. The high-voltage relays and associated high-voltage circuitry shall be tested by the user of computercontrolled systems per the equipment manufacturer’s instructions system diagnostics.
Requirement, clause number Test method number Clause number The referenced clause number has proven to be: The number of power pins tested on Terminal A may be reduced if the power pin group is connected on a package plane see clause 4.