Purchase your copy of ASTM E – 02() as a PDF download or hard copy directly from the official BSI Shop. All BSI British Standards. Find the most up-to-date version of ASTM E at Engineering ASTM E – E – 02 The test methods provide for reporting of specic, distinctive informati.
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ASTM E1181 – 02(2015)
Suppose that measurements indicate that the surface layers each average 3. A tube whose wall thickness is small compared to its outside diameter may be treated as equivalent to a product of rectangular cross-section, in that a surface layer of a given depth at 5 the outside diameter covers essentially the same area as a layer of the same depth at the inside diameter.
Make at least 10 measurements at different locations of the depth of a given surface layer, and calculate the average depth from those measurements. The area fraction occupied by the ne grain was calculated as asstm total intercept length in the ne grain region An arbitrary division was made between the two distinct distributions of grain sizes.
Any of the Intercept Procedures of E may be used, within the regions of distinct grain size. E — 02 The test methods provide for reporting of specic, distinctive information for each type of duplex grain size. If neither of these is practical, then, as an absolute minimum, the area of the specimen to be examined must include one complete traverse from surface to surface of the original plate section.
MSQ ASTM Grain Size Calculation, Grain Size Measurement
An example photomicrograph of the wide-range condition appears in Fig. Also use the planimeter to measure the total area of the image. For comparison of mechanical properties with metallurgical features, or for specication purposes, it may be important to be able to characterize grain size in such materials.
A sample application of this procedure appears in Appendix X1, along with formulas for calculating mean intercept lengths, asfm area fractions. For comparison of mechanical properties with metallurgical features, or for specification purposes, it may be important to be able to characterize grain size in such materials.
Practice E FIG. The regions occupied by a distinct grain size are manually outlined on a photomicrograph or transparent overlay. Accordingly, astmm longitudinal orientation is recommended, with one exception. For the coarse grain size, the number of intercepts totaled 13, and the intercept length totaled If you feel that your comments have not received a fair hearing you should make your views known to the ASTM Committee on Standards, at the address shown below.
For a tubular product, awtm of area fractions made on longitudinal sections are reasonable approximations of the same estimates made on transverse sections. An example of a complete report e181 read: Compare such gures with eyepiece or projected images from a microscope, or with photomicrographs.
Use Methods E to determine the size of the smallest grains found in the specimen, and Methods E to estimate the size of the largest grain found in the specimen. In this example, the results would be reported as: All results may be erased by clicking on the “Erase All Results” button.
Use Methods Awtm to determine the average size of the balance of the grains in the specimen.
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The grid spacing should be matched to the image magnication to fulll the recommendations of Practice E Users easily set calibration, choose preparation options and set the desired measurement method.
However, asgm test methods described here for area fraction estimation may be of use in describing duplex grain structures. Examples of random duplex grain sizes include: This value was then adtm in the eighth column.
Users of this standard are expressly advised that determination of the validity of any such patent rights, and the risk of infringement of such rights, are entirely their own responsibility. Then use the planimeter to measure the area enclosed within each outlined region. This procedure can be carried out much more efficiently through the use of an automated image analysis system with an electronic pencil or cursor, or through the use of a semi-automated image analysis system with a digitizing tablet and electronic pencil or cursor.
These procedures will be more difficult to apply than the Comparison Procedure of E, but will offer greater precision. The area of each of those regions is then measured by tracing its outline with the wstm.
The grid should consist of equally spaced points formed by the intersection of ne lines.
An example of such a histogram is shown in Fig. Accordingly, the layer depth of 1. The test methods separate duplex grain sizes into one of two distinct classes, then into specific types within those classes, and provide systems for grain size characterization of each type. If there is any doubt whether a point falls inside or outside the outlined region, count the point as one half.
ASTM E – 02() Standard Test Methods for Characterizing Duplex Grain Sizes
These data may be used to assess the nature of the observed grain size distribution, and to determine mean intercept lengths and area fractions for distinct segments of a total distribution.
An example photomicrograph of the asrm condition appears in Fig. Sampling and Test Specimens 7. Presentation of the data as a histogram or a frequency plot is also shown. Individual reprints single or multiple copies of this standard may be obtained by contacting ASTM at the above address or at phonefaxor service astm.
Signicance and Use 5.